DAGM German Conference on Pattern Recognition, Jena, September 9 - September 11, 2009

The organizers of the DAGM 2009 would like to thank all visitors and presenters for contributing to this successful symposium!

Every participant is invited to send us photos and videos to be published on this homepage.


The proceedings are now available online on springerlink.com.

The 31st annual pattern recognition symposium of the German Association for Pattern Recognition DAGM (Deutsche Arbeitsgemeinschaft für Mustererkennung DAGM e.V.) will take place at the Friedrich Schiller University of Jena* on September 9-11, 2009.

It is organized by the Chair for Computer Vision of the University Jena and the Fraunhofer IOF Jena.

Topics include, but are not limited to:


  • Machine Learning and Pattern Recognition
  • Image Analysis and Computer Vision
  • Mathematical Foundations and Statistical Data Analysis
  • Applications in Natural Sciences and Engineering
  • Biomedical Data Analysis and Imaging, Biometrics

Joachim Denzler

FSU Jena

Gunther Notni

Fraunhofer IOF Jena